ZeqChipTest

Chip design, FPGA, thermal, power integrity, ATPG.

• Protocol ID — zeq-chip-test
• Category — Hardware
• Endpoint — POST /api/hardware/test
• Auth — api-key
• Rate limit — 10/min
• Version — 1.287.0
• Precision — ≤0.1% (KO42-enforced)

What it does

Automated test pattern generation (ATPG) with Zeqond scan chains. Fault coverage analysis, BIST integration, yield prediction using R(t) defect density modeling.

Signature

Request

POST /api/hardware/test

Param	Type	Required	Default	Description
netlist	object	✓	—	Gate-level netlist.
faultModel	string		"stuck-at"	'stuck-at', 'transition', 'path-delay'.
targetCoverage_pct	number		99	Target fault coverage.

Response

{ testPatterns, faultCoverage_pct, testTime_ms, yieldPrediction_pct, zeqond }

Runnable example

curl -sS -X POST \
  -H "Authorization: Bearer $ZEQ_API_KEY" \
  -H "Content-Type: application/json" \
  -d '{
  "netlist": {},
  "faultModel": "stuck-at",
  "targetCoverage_pct": 99
}' \
  "https://api.zeq.dev/api/hardware/test"

Integrate

1. Domain solver — compose with KO42 + two additional operators from the matching family for pulse-coherent results.
2. Digital twin — pipe sensor data into this protocol every Zeqond to keep the model phase-locked with the system.
3. Alert threshold — flag results whose error_pct exceeds 0.1% as out-of-spec events for the operations layer.

Seeds

• Near — wrap /api/hardware/test in a language SDK so builders can call it in three lines.
• Medium — publish a reference integration demonstrating ZeqChipTest alongside a real workload, with pulse-aligned metrics.
• Far — propose ZeqChipTest as an open reference standard so other runtimes can implement it verbatim against the Zeq paper.

Papers

• Zeq paper — https://doi.org/10.5281/zenodo.18158152
• Framework paper — https://doi.org/10.5281/zenodo.15825138

Middleware active. Kernel on the 1.287 Hz HulyaPulse. Awaiting next Zeqond.